Zeiss Supra 55VP FEG SEM

Scanning electron microscope used for materials analysis

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Post author: Andrew Sullivan. Last update: 04/04/2016 at 2:09 pm by Andrew Sullivan.

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Overview

Manufacturer: Zeiss

The Supra 55VP is a high resolution scanning electron microscope (SEM) that uses a Schottky-type field-emission electron source. A beam booster is used to optimise electron optical performance at all accelerating voltages. In addition, the optical column has no crossovers and utilises a magnetic/electrostatic objective lens to minimise beam imperfections at low voltage by reducing chromatic aberration. This instrument can also be operated in Variable Pressure Mode, up to a pressure of 133Pa, thus providing charge compensation for materials with little or no conductivity.

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Capacity: We encourage greater utilisation

Access: External researcher use available
Tags: SEM