Zeiss Supra 55VP FEG SEM

Scanning electron microscope used for materials analysis


You need to login or register to bookmark/favorite this content.

Post author: Andrew Sullivan. Last update: 04/04/2016 at 2:09 pm by Andrew Sullivan.


Dr. Andrew Sullivan

Phone: +61 3 522 73468



Manufacturer: Zeiss

The Supra 55VP is a high resolution scanning electron microscope (SEM) that uses a Schottky-type field-emission electron source. A beam booster is used to optimise electron optical performance at all accelerating voltages. In addition, the optical column has no crossovers and utilises a magnetic/electrostatic objective lens to minimise beam imperfections at low voltage by reducing chromatic aberration. This instrument can also be operated in Variable Pressure Mode, up to a pressure of 133Pa, thus providing charge compensation for materials with little or no conductivity.

Benefits of the Zeiss Supra 55VP FEG SEM

None have been added

Technical features and specifications

None have been added


Capacity: We encourage greater utilisation

Access: External researcher use available
Tags: SEM