Variable Angle Spectroscopic Ellipsometer

Optical characterisation using the polarisation of light used for Thin film characterisation, thickness and optical properties

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Post author: MCN. Last update: 16/09/2013 at 9:40 am by MCN.

Overview

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Details

Overview

Manufacturer: J.A. Woollam, M-2000DI. Installed 2012.

Automated mapping stage, Wavelength range 193-1690nm

Benefits of the Variable Angle Spectroscopic Ellipsometer

Focus probes, liquid cell, transmission stage, in-situ mounting

Technical features and specifications

None have been added

Tags

Capacity: We encourage greater utilisation
Operation: User operated training provided
Access: External researcher use available