Optical characterisation using the polarisation of light used for Thin film characterisation, thickness and optical properties
Post author: MCN. Last update: 16/09/2013 at 9:40 am by MCN.
Manufacturer: J.A. Woollam, M-2000DI. Installed 2012.
Automated mapping stage, Wavelength range 193-1690nm
Benefits of the Variable Angle Spectroscopic Ellipsometer
Focus probes, liquid cell, transmission stage, in-situ mounting
Technical features and specifications
None have been added