Instrument: SEM

A Phenom Pure 1 Scanning Electron Microscope capable of 20,000x magnification used for acquiring electron microscopy images of solid samples


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Post author: Nicole McMillan. Last update: 20/01/2016 at 10:48 am by Nicole McMillan.



Dr. Phil Wright

Phone: 9903 9020



Manufacturer: Phenom, FEI. Installed 2010.

A bench-top scanning electron microscope capable of imaging at a magnification of 20,000x with a working spatial resolution of around 500nm

Benefits of the SEM

– Easy to use by non-experts
– 20,000x magnification and better than 500 nm spatial resolution
– Images can be acquired within minutes

Technical features and specifications

– 20,000x magnification
– Bright and dark field modes
– High sensitivity back-scattered electron detector
– Image formats: JPEG, TIFF, BMP
– Image resolution: 456 x 456, 684 x 684, 1024 x 1024 or 2048 x 2048 pixels
– USB flash drive
– Sample size: 12 mm


Capacity: We encourage greater utilisation
Operation: User operated training provided, User or facility staff operate, User or facility staff operate pricing may vary
Access: Access pricing may vary, Book it on ARIN, External researcher use available