X-Ray Diffractometer used for Measuring residual stress in materials
Post author: Lauren Hyde. Last update: 21/08/2014 at 2:53 pm by Lauren Hyde.
The residual stress instrument is a Proto iXRD Residual Stress and Retained Austenite Measurement System, fitted in a laboratory x-ray cabinet. The instrument is capable of collecting residual stress data on a wide range of material and sample types.
We offer a consultancy program, and can provide information on the integration of diffraction analysis into your programmes of interest.
Benefits of the Residual Stress X-Ray Diffractometer
The instrument gives a fast, easy, non-destructive way in which to determine the residual stress present in you material of interest.
Technical features and specifications
The residual stress instrument is currently fitted with a chromium x-ray source, but is also able to use copper and manganese sources, depending on your sample.
An XYZR stage is fitted with +/- 120 mm travel is XY, ~300mm in Z and 360° rotation. A four point bend test stage is available for samples of at least 80 mm long and at most 23 mm wide.
There are a range of spot sizes and shapes, depending on the samples to be measured.
Stress mapping of surfaces is possible.
The instrument can also measure retained austenite levels in steels.