Residual Stress X-Ray Diffractometer

X-Ray Diffractometer used for Measuring residual stress in materials

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Post author: Lauren Hyde. Last update: 21/08/2014 at 2:53 pm by Lauren Hyde.

Overview

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Details

Overview

Manufacturer: Proto

The residual stress instrument is a Proto iXRD Residual Stress and Retained Austenite Measurement System, fitted in a laboratory x-ray cabinet. The instrument is capable of collecting residual stress data on a wide range of material and sample types.

We offer a consultancy program, and can provide information on the integration of diffraction analysis into your programmes of interest.

Benefits of the Residual Stress X-Ray Diffractometer

The instrument gives a fast, easy, non-destructive way in which to determine the residual stress present in you material of interest.

Technical features and specifications

The residual stress instrument is currently fitted with a chromium x-ray source, but is also able to use copper and manganese sources, depending on your sample.

An XYZR stage is fitted with +/- 120 mm travel is XY, ~300mm in Z and 360° rotation. A four point bend test stage is available for samples of at least 80 mm long and at most 23 mm wide.

There are a range of spot sizes and shapes, depending on the samples to be measured.

Stress mapping of surfaces is possible.

The instrument can also measure retained austenite levels in steels.

Tags

Capacity: We encourage greater utilisation
Operation: Facility staff operate this instrument
Access: Access pricing may vary