Scanning Electron Microscope used for Imaging and elemental analysis and crystallinity
Post author: Philip Francis. Last update: 01/03/2014 at 5:24 pm by Philip Francis.
Manufacturer: Philips (FEI), XL30. Installed 2000.
LaB6 electron source SEM
Oxford AZtec EDS (Energy Dispersive X-ray Spectroscopy for elemental composition analysis)
HKL EBSD system (Electron BackScatter Diffraction for crystallinity of surface mapping)
Funding sources: Institutional
Benefits of the Philips XL30 SEM, Aztec EDS, EBSD
Imaging from 20 x up to 100,000 X
Microscopic Elemental composition analysis from 1 mm down to 1 um
Technical features and specifications
None have been added