Philips XL30 SEM, Aztec EDS, EBSD

Scanning Electron Microscope used for Imaging and elemental analysis and crystallinity


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Post author: Philip Francis. Last update: 01/03/2014 at 5:24 pm by Philip Francis.





Manufacturer: Philips (FEI), XL30. Installed 2000.

LaB6 electron source SEM
Oxford AZtec EDS (Energy Dispersive X-ray Spectroscopy for elemental composition analysis)
HKL EBSD system (Electron BackScatter Diffraction for crystallinity of surface mapping)

Funding sources: Institutional

Benefits of the Philips XL30 SEM, Aztec EDS, EBSD

Imaging from 20 x up to 100,000 X
Microscopic Elemental composition analysis from 1 mm down to 1 um

Technical features and specifications

None have been added


Capacity: This instrument is heavily booked
Operation: User operated training provided, User or facility staff operate pricing may vary
Access: External researcher use available