Nanowizard II AFM

Instrument: Nanowizard II AFM

Atomic Force Microscope (AFM) used for Materials characterisation, biological samples, topography, force measurements

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Post author: Lauren Hyde. Last update: 16/06/2014 at 1:21 pm by Lauren Hyde.

Overview

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Details

Overview

Manufacturer: JPK Instruments

Stand-alone tip scanning design for flexibility in the applications.
Patented DirectOverlay™ software feature for combining AFM and optical images distortion free.
In-situ imaging in biological/chemical fluids or in air.
Measurements at variable temperatures with perfusion possibilities.
Large scan field of 100×100×15 µm3 with closed loop performance through capacitive sensors.

Benefits of the Nanowizard II AFM

This instrument is ideal for soft material (live cells, cell membranes, biofilms) as well as force interactions.

The major advantage of this is system is that living cells can be incubated and held under a controlled atmosphere within the AFM cell.

Technical features and specifications

· X-Y scan range: 100 µm Z scan range: 15 µm

· In-situ imaging in biological/chemical fluids or in air

· Supports all major AFM modes

· Stand-alone tip scanning design for flexibility in the applications

· Patented DirectOverlay™ software feature for combining AFM and optical images distortion free

· n-situ imaging in biological/chemical fluids or in air

· Measurements at variable temperatures with perfusion possibilities

· Large scan field of 100×100×15 µm3 with closed loop performance through capacitive sensors

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Capacity: We encourage greater utilisation
Operation: User operated training provided, User or facility staff operate pricing may vary
Access: Access pricing may vary