Leo 1530 FEG SEM

Instrument: Leo 1530 FEG SEM

Scanning electron microscope used for Visualisation of of micron to nano-scale materials


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Post author: Andrew Sullivan. Last update: 04/04/2016 at 2:07 pm by Andrew Sullivan.


Dr. Andrew Sullivan

Phone: +61 3 522 73468



The LEO 1530 is a high resolution scanning electron microscope (SEM) that uses a Schottky-type field-emission electron source. A beam booster is used to optimise electron optical performance at all accelerating voltages. In addition, the optical column has no crossovers and utilises a magnetic/electrostatic objective lens to minimise beam imperfections at low voltage by reducing chromatic aberration.

Benefits of the Leo 1530 FEG SEM

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Technical features and specifications

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Capacity: We encourage greater utilisation

Access: External researcher use available
Tags: SEM