Leo 1530 FEG SEM

Instrument: Leo 1530 FEG SEM

Scanning electron microscope used for Visualisation of of micron to nano-scale materials

Actions

You need to login or register to bookmark/favorite this content.

Post author: Andrew Sullivan. Last update: 04/04/2016 at 2:07 pm by Andrew Sullivan.

Overview

Dr. Andrew Sullivan

Phone: +61 3 522 73468

Details

Overview

The LEO 1530 is a high resolution scanning electron microscope (SEM) that uses a Schottky-type field-emission electron source. A beam booster is used to optimise electron optical performance at all accelerating voltages. In addition, the optical column has no crossovers and utilises a magnetic/electrostatic objective lens to minimise beam imperfections at low voltage by reducing chromatic aberration.

Benefits of the Leo 1530 FEG SEM

None have been added

Technical features and specifications

None have been added

Tags

Capacity: We encourage greater utilisation

Access: External researcher use available
Tags: SEM