Laser Beam Induced Current Microscope

Laser Beam Induced Current Microscope

Scanning Laser Microscope for mapping photocurrents used for mapping photocurrents in semiconducting materials

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Post author: Colin Macrae. Last update: 01/07/2014 at 4:36 pm by Colin Macrae.

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Overview

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Details

Overview

Manufacturer: CSIRO. Installed 2010.

A Laser Beam Induced Current (LBIC) microscope installed on a Scanning Laser Microscope is capable of mapping photocurrents across materials with micron level precision. The temperature of the sample can be set between 78K and 300K. The excitation laser wavelength can be selected between 633 nm and 405 nm at present but other laser lines are available if required.

Benefits of the Laser Beam Induced Current Microscope

Mapping photocurrents in minerals and semiconducting structures without making physical contact to metallisation layers connected to the junction being imaged. Images collected are currently qualitative.

Technical features and specifications

Spot size approximately 2um
Laser power can be varied and modulated for lock-in amplifier usage.
Several laser sources for different material needs

Tags

Capacity: We encourage greater utilisation

Access: Access pricing may vary, External researcher use available
Tags: laser beam induced current, photocurrent mapper