Jeol JSM 7800F FEG-SEM

Scanning electron microscope used for Micro and nano-scale materials imaging


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Post author: Andrew Sullivan. Last update: 04/04/2016 at 2:05 pm by Andrew Sullivan.


Dr. Andrew Sullivan

Phone: +61 3 522 73468



The JSM-7800F uniquely combines an in-lens field emission gun with an aperture angle control lens (ACL), optimizing large probe currents (up to 200 nA) for operation at the smallest probe diameter. The new super hybrid lens design allows high resolution imaging of any type of specimen. The SEM performs well at low accelerating voltage X-ray spectroscopy, combining large beam currents with a small interaction volume and offering analytical resolution to the sub 100nm scale. Beam deceleration in GB Mode provides charge balance and high resolution imaging of surfaces and nonconductive samples by effectively reducing effects of lens aberrations.

Benefits of the Jeol JSM 7800F FEG-SEM

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Technical features and specifications

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Capacity: We encourage greater utilisation

Access: External researcher use available
Tags: SEM