JEOL JSM-7001F FEGSEM

Scanning electron microscope used for Topography, morphology, composition, EBSD

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Post author: Peter Miller. Last update: 27/10/2015 at 3:57 pm by Peter Miller.

Overview

Dr. Peter Miller

Phone: 03 9905 5291

Details

Overview

Manufacturer: JEOL, JSM-7001F FEGSEM. Installed 2008.

Excellent analytical microscope capable of large probe currents making it ideal for x-ray mapping and EBSD acquisition. The large specimen exchange airlock and large working distance make this a suitable microscope for analysing tall samples requiring large depth of field.

Benefits of the JEOL JSM-7001F FEGSEM

Large probe current ideal for x-ray mapping and EBSD.

Technical features and specifications

FEG; 5-axis stage; IR chamber camera; oil-free pumping system; retractable BSE detector; specimen exchange airlock; cryo-trap; Oxford Instruments AZtec X-ray analysis system and 80mm2 SDD; Oxford Instruments Nordlys Max2 EBSD detector.

Tags

Capacity: This instrument is heavily booked
Operation: User operated training provided, User or facility staff operate, User or facility staff operate pricing may vary
Access: Access pricing may vary, External researcher use available
Tags: EBSD, EDX, SEM