JEOL JEM 2100F FEG TEM

Transmission electron microscope used for Visualisation of micro and nano-scale materials

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Post author: Andrew Sullivan. Last update: 04/04/2016 at 2:06 pm by Andrew Sullivan.

Overview

Dr. Andrew Sullivan

Phone: +61 3 522 73468

Details

Overview

The JEOL JEM-2100F is a high-performance Transmission Electron Microscope (TEM) with a field emission electron source for analyses at the atomic/molecule level in materials science, nanotechnology and life science.

Benefits of the JEOL JEM 2100F FEG TEM

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Technical features and specifications

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Capacity: We encourage greater utilisation

Access: External researcher use available