Field Emission (FEG) Electron Microprobe microanalyser (EPMA) for quantitative trace analysis (Be-U), high resolution imaging and chemical and structural mapping used for Trace element analysis, Mapping, trace speciation
Post author: Colin Macrae. Last update: 01/04/2014 at 5:13 pm by Colin Macrae.
Manufacturer: JEOL & CSIRO, JEOL 8500F (CL). Installed 2006.
Benefits of the JEOL 8500F (CL) Electron Probe Microanalyser with 5 Wavelength Dispersive Spectrometers, 2 Energy Dispersive Spectrometers and Cathodoluminescence Spectrometry
The FEG-EPMA offer quantitative trace microanalysis with detection limits down to 10ppm , trace speciation through advanced cathodoluminescence spectral mapping and analysis, Advanced Data analysis through an inhouse developed hyperspectral data analysis – CHIMAGE.
A large collection of characterized mineral and synthetic standards are available for use with this instrument offering the ability to analyse majors, minors and traces and correct for matrix effects as well as measure uncertainty in measurement.
Technical features and specifications
This FEG-EPMA has specialised set of analysing crystals with a high degree of sensitivity for light elements. A special airlock has been developed to plasma clean all samples to reduce surface contamination and lower detection limits for light elements. The light optics have been optimised enabling weak cathodoluminescence signals to be captured and mapped together with x-ray and electron signals. Twin SDD x-ray detectors are fully integrated into the FEG-EPMA so that maps have data captured form all spectrometers and detectors on the instrument in parallel. This data can then be analysed using advanced cluster routines implemented in CHIMAGE.