Jeol 2100F TEM/STEM with SDD X-ray detector, Gatan Image Filter (2010), CCD camera

FEG Scanning Transmission Electron Microscope used for Imaging and analysis up to atomic resolution

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Post author: Philip Francis. Last update: 01/03/2014 at 5:30 pm by Philip Francis.

Overview

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Details

Overview

Manufacturer: JEOL, 2100F STEM. Installed 2010.

Has Gatan CCD camera – Orius SC1000 (model 832)
EELS (Electron Energy-loss spectometer for chemical composition analysis)
and Oxford AZtec SDD EDS (Energy dispersive X-ray Spectrometer for elemental composition analysis)

Funding sources: ARC LEIF

Benefits of the Jeol 2100F TEM/STEM with SDD X-ray detector, Gatan Image Filter (2010), CCD camera

Can do electron tomography to get 3D imaging os samples at near atomic resolution

Technical features and specifications

None have been added

Price list

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Capacity: We encourage greater utilisation
Operation: User or facility staff operate pricing may vary

Tags: 3D, EDS, EELS, STEM, TEM, Tomography