FEG Scanning Transmission Electron Microscope used for Imaging and analysis up to atomic resolution
Post author: Philip Francis. Last update: 01/03/2014 at 5:30 pm by Philip Francis.
Manufacturer: JEOL, 2100F STEM. Installed 2010.
Has Gatan CCD camera – Orius SC1000 (model 832)
EELS (Electron Energy-loss spectometer for chemical composition analysis)
and Oxford AZtec SDD EDS (Energy dispersive X-ray Spectrometer for elemental composition analysis)
Funding sources: ARC LEIF
Benefits of the Jeol 2100F TEM/STEM with SDD X-ray detector, Gatan Image Filter (2010), CCD camera
Can do electron tomography to get 3D imaging os samples at near atomic resolution
Technical features and specifications
None have been added