Jeol 2010 TEM with Link Si(Li) X-ray detector, Gatan Image Filter (2001), CCD camera

Transmission Electron Microscope used for High resolution imaging and analysis

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Post author: Philip Francis. Last update: 18/10/2013 at 3:35 pm by Philip Francis.

Overview

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Details

Overview

Manufacturer: JEOL, 2010 TEM. Installed 1990.

Transmission Electron Microscope (200KV)
Has gatan GIF Electron Energy Loss Spectrometer
Has EDS X-ray analyser

Funding sources: ARC LEIF

Benefits of the Jeol 2010 TEM with Link Si(Li) X-ray detector, Gatan Image Filter (2001), CCD camera

Can give elemental and chemical analysis at atomic resolution

Technical features and specifications

None have been added

Price list

Pricing category Price
   

Tags

Capacity: We encourage greater utilisation
Operation: User operated training provided, User or facility staff operate pricing may vary

Tags: EDS, EELS, TEM