Transmission Electron Microscope used for High resolution imaging and analysis
Post author: Philip Francis. Last update: 18/10/2013 at 3:35 pm by Philip Francis.
Manufacturer: JEOL, 2010 TEM. Installed 1990.
Transmission Electron Microscope (200KV)
Has gatan GIF Electron Energy Loss Spectrometer
Has EDS X-ray analyser
Funding sources: ARC LEIF
Benefits of the Jeol 2010 TEM with Link Si(Li) X-ray detector, Gatan Image Filter (2001), CCD camera
Can give elemental and chemical analysis at atomic resolution
Technical features and specifications
None have been added