FEI Verios XHR FEG SEM

SEM used for Extreme high resolution imaging of light element samples eg Carbon nanotubes

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Post author: Philip Francis. Last update: 01/06/2016 at 5:34 pm by Philip Francis.

Overview

Mr. Philip Francis

Phone: (03) 9925 2609

Details

Overview

Manufacturer: FEI, Verios. Installed 2015.

Extreme high resolution SEM
Speciality is low voltage imaging showing the true surface of light element samples eg carbon anotubes, graphene, diamond etc and biological samples

Benefits of the FEI Verios XHR FEG SEM

Extreme high resolution even at low landing energies, permitting imaging of carbon based samples at a resolution of 0.8 nm

Technical features and specifications

None have been added

Tags

Capacity: We encourage greater utilisation
Operation: Facility staff operate this instrument, User operated training provided, User or facility staff operate
Access: External researcher use available