SEM used for Extreme high resolution imaging of light element samples eg Carbon nanotubes
Post author: Philip Francis. Last update: 01/06/2016 at 5:34 pm by Philip Francis.
Manufacturer: FEI, Verios. Installed 2015.
Extreme high resolution SEM
Speciality is low voltage imaging showing the true surface of light element samples eg carbon anotubes, graphene, diamond etc and biological samples
Benefits of the FEI Verios XHR FEG SEM
Extreme high resolution even at low landing energies, permitting imaging of carbon based samples at a resolution of 0.8 nm
Technical features and specifications
None have been added