FEI Quanta-400F FEG-ESEM with Bruker SDD X-ray detector, Bruker Electron Backscatter Detector (EBSD), Hot stage (1000°C) and Peltier Stage

High resolution Environmental SEM capable of imaging, X-ray mapping, and Electron Diffraction mapping, used for Quantitative microanalysis, Hyperspectral Mapping, Electron Diffraction mapping, Imaging wet and hydrated samples

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Post author: Colin Macrae. Last update: 02/04/2014 at 9:48 am by Colin Macrae.

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Details

Overview

Manufacturer: FEI, FEG-Quanta-400. Installed 2005.

FEG-Environmental SEM with Bruker SDD X-ray detector , Bruker Electron Backscatter Detector (EBSD), Hot stage (1000°C) and Peltier Stage

Benefits of the FEI Quanta-400F FEG-ESEM with Bruker SDD X-ray detector, Bruker Electron Backscatter Detector (EBSD), Hot stage (1000°C) and Peltier Stage

This scanning electron microscope (SEM) is equipped with multiple electron detectors and can operate in low vacuums and image hydrated materials without the need for advanced sample preparation. Qualitative and quantitative elemental analysis are available on this instrument with a state-of-the-art microanalysis packages. The Field Emission Gun enables both high current for fast mapping and high resolution imaging and low accelerating voltages.

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Tags

Capacity: This instrument is heavily booked
Operation: User operated training provided
Access: External researcher use available, Internal researcher use only