FEI Quanta 3D FEG FIB-SEM

Electron microscope used for analysis and manipulation of microstructures

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Post author: Andrew Sullivan. Last update: 04/04/2016 at 2:09 pm by Andrew Sullivan.

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Dr. Andrew Sullivan

Phone: +61 3 522 73468

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Overview

Manufacturer: FEI

The FEI Quanta 3D FEG FIB-SEM enables imaging, analysis and manipulation of microstructures using a combination of a field-emission gun scanning electron microscope with a gallium focused ion beam and a platinum gas-injection system.

Benefits of the FEI Quanta 3D FEG FIB-SEM

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Capacity: We encourage greater utilisation

Access: External researcher use available