Scanning electron microscope used for Topography, morphology and composition
Post author: Peter Miller. Last update: 27/10/2015 at 3:54 pm by Peter Miller.
Manufacturer: FEI, Nova NanoSEM 450 FEGSEM. Installed 2012.
A high resolution scanning electron microscope with in-lens detectors and advanced optics allowing high contrast imaging at low accelerating voltages. The microscope can operate in both high vacuum and low vacuum environments, enabling the imaging of insulating materials without the need for sample coating. This system is also fitted with a large area SDD x-ray detector allowing for fast x-ray mapping with large count rates.
Benefits of the FEI Nova NanoSEM 450 FEGSEM
In-lens detectors and advanced optics to allow improved resolution at low accelerating voltages.
Technical features and specifications
FEG; 5-axis stage; IR chamber camera; oil-free pumping system; retractable DBS annular BSE detector; low vacuum imaging; LV-BSE detector (GAD); Helix detector; beam deceleration; in-lens detectors; NavCam; plasma cleaner; cryo-trap; Bruker Quantax 400 X-ray analysis system and 60mm2 SDD with super light element window (slew).
This instrument is heavily booked
Operation: User operated training provided, User or facility staff operate, User or facility staff operate pricing may vary
Access: External researcher use available