FEI Nova Nanolab200 dual beam, focussed ion beam system

Scanning Electron Microscope, Focussed ion beam instrument used for Scanning electron microscopy, nanofabricaiton, elemental anaylsis, patterning

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Post author: Eric Hanssen. Last update: 13/10/2014 at 4:47 pm by Eric Hanssen.

Overview

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Details

Overview

Manufacturer: FEi, Nova Nanolab 200. Installed 2006.

Combined SEM and gallium ion beam instrument. Equipped with EDAX, Pt-deposition system and micromanipulator. Suitable for device cross-sectioning, TEM sample preparation, nanofabrication and 3D reconstruction using the Slice and View system.
FEI Tecnai F3.

Benefits of the FEI Nova Nanolab200 dual beam, focussed ion beam system

Combined SEM and gallium ion beam instrument. Equipped with EDAX, Pt-deposition system and micromanipulator. Suitable for device cross-sectioning, TEM sample preparation, nanofabrication and 3D reconstruction using the Slice and View system.
FEI Tecnai F3.

Technical features and specifications

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Price list

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Capacity: We encourage greater utilisation
Operation: User or facility staff operate pricing may vary
Access: External researcher use available