Spectroscopic Ellispometer used for Thin Film Characterisation
Post author: Karyn Jarvis. Last update: 22/09/2015 at 4:25 pm by Karyn Jarvis.
Manufacturer: J.A.Woollam, M-2000 XI. Installed 2012.
Spectroscopic ellipsometry is an optical characterisation technique typically used to determine the thickness of thin films. Polarised light is shined on the surface, reflected and received by the detector. The changes in polarisation upon interaction with the sample surface enable a number of other parameters also to be determined: roughness, crystalline nature, doping concentration and electrical conductivity.
Benefits of the Ellipsometer
Wide spectral Range Ellipsometer
Characterisation of optical properties of thin films
Non-invasive film thickness measurement
Technical features and specifications
Spectral Range of 210-1690 nm
Automated Sample Translation
We encourage greater utilisation
Operation: User operated training provided, User or facility staff operate, User or facility staff operate pricing may vary
Access: Access pricing may vary, External researcher use availableCapacity: