Transmission electron microscope used for This instrument is capable of imaging atomic structures with a resolution of less than one-tenth of a nanometre.
Post author: Peter Miller. Last update: 27/10/2015 at 3:49 pm by Peter Miller.
Manufacturer: FEI, Double-corrected Titan3 80-300 FEGTEM. Installed 2008.
A Shottky field emission transmission electron microscope fitted with spherical aberration correctors on the probe and image-forming lens systems. This instrument is capable of imaging atomic structures with a resolution of less than one-tenth of a nanometre. At the same time, it can acquire chemical information selectively from just one or two atomic columns. The microscope configuration includes electron tomography for three dimensional imaging of structures and an energy imaging filter for composition and bonding measurements.
Funding sources: Institutional, Victorian State Government
Benefits of the Double-corrected Fei Titan3 80-300 FEGTEM
Study of structure and composition of non-biological materials down to the atomic scale.
Technical features and specifications
300kV; FEG-TEM/STEM; Super-Twin pole piece; CEOS Cs probe corrector; CEOS Cs image corrector; Fischione Instruments 3000 annular dark field detector; on-axis BF/DF detector; Bruker 60 mm2 retractable windowless SDD X-ray detector and analyser; Gatan Tridium 863 P image filter; Gatan UltraScan 1000 P (2kx2k) CCD camera; 3-axis piezostage, high stability tomography goniometer; Gatan 636 Double tilt cooling holder; Gatan HCHTR3000 Double tilt He holder; Fischione Instruments 2020 ultra-high tilt tomography holder; Fischione Instruments 2040 Dual-axis advanced tomography holder; Fischione Instruments 2050 on-axis rotation tomography holder.
This instrument is heavily booked
Operation: User operated training provided, User or facility staff operate, User or facility staff operate pricing may vary
Access: Access pricing may vary, External researcher use availableCapacity: