Atomic Force Microscope (AFM) used for Materials characterisation, topography, force measurements, magnetic and electrical properties
Post author: Lauren Hyde. Last update: 16/06/2014 at 1:18 pm by Lauren Hyde.
This AFM is very versatile and a wide range of measurements can be carried out: imaging (tapping and contact mode), magnetic and electric forces, force modulation.
Benefits of the Dimension 3100
Perfect for a first contact with AFM
Good for big samples
Technical features and specifications
Maxium imaging area x/y: 90 μm, z:6μm
Maximum sample size 150 mm diameter and 12mm height
Resolution x/y: 2-5 nm, z:0.05-1 nm
Performs as several types of SPM
Manufacturer: Digital Instruments (Currently Bruker)