Dimension 3100

Instrument: Dimension 3100

Atomic Force Microscope (AFM) used for Materials characterisation, topography, force measurements, magnetic and electrical properties

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Post author: Lauren Hyde. Last update: 16/06/2014 at 1:18 pm by Lauren Hyde.

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Overview

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Details

Overview

Manufacturer: Veeco

This AFM is very versatile and a wide range of measurements can be carried out: imaging (tapping and contact mode), magnetic and electric forces, force modulation.

Benefits of the Dimension 3100

Perfect for a first contact with AFM
Good for big samples
Electrical measurements

Technical features and specifications

Maxium imaging area x/y: 90 μm, z:6μm
Maximum sample size 150 mm diameter and 12mm height
Resolution x/y: 2-5 nm, z:0.05-1 nm
Performs as several types of SPM
Manufacturer: Digital Instruments (Currently Bruker)

Tags

Capacity: We encourage greater utilisation
Operation: User operated training provided, User or facility staff operate pricing may vary
Access: External researcher use available