Cleanroom (Dimension iCon) AFM

Atomic Force Microscope used for Nanoscale materials and surface characterisation, electrical materials characterisation, force and mechanical properties mapping


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Post author: MCN. Last update: 23/09/2013 at 3:59 pm by MCN.





Manufacturer: Bruker, Dimension iCon. Installed 2010.

iCon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis and angstroms in X-Y; large-sample (90-micron) scan range; significantly reduced noise floor enables imaging at atomic level in contact mode, with less than 30pm in tapping mode; drift rates less than 200pm per minute render distortion-free images; integrated feedback alignment tools deliver quick and optimized probe positioning; high-resolution camera and X-Y positioning permit faster and more efficient sample navigation; wide-open access to tip and sample accommodates a large variety of standard and customized experiments, execute temperature control and thermal analysis on samples from –35°C to 250°C

Benefits of the Cleanroom (Dimension iCon) AFM

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Technical features and specifications

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Capacity: We encourage greater utilisation
Operation: User or facility staff operate pricing may vary
Access: External researcher use available